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Работы, на которые ссылается эта работа
Работ: 50
Работа: On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors). 3. The Minimum of Temperature Dependence of Resistivity
Conduction Mechanism in RuO2-Based Thick Films
К. Flachbart, V. Pavl�k, N. Toma?ovi?ov� +4
Статья1998Цитирований: 8ABIElectrical properties and conduction mechanisms of Ru-based thick-film (cermet) resistors
Статья1977Цитирований: 7ABIRuthenium clusters in lead-borosilicate glass in thick film resistors
Kenji Adachi, Sadahiro lida, Kazuhide Hayashi
Статья1994Цитирований: 6ABIElectronic Properties of Doped Semiconductors
B. I. Shklovskiǐ, Alex L. Efros
Книга1984Цитирований: 6ABIMicrostructural Analysis and Transport Properties of RuO<sub>2</sub>-Based Thick Film Resistors
S. Gabáni, К. Flachbart, V. Pavlı́k +2
Статья2008Цитирований: 3ABIEvolution of ruthenate-based thick film cermet resistors
B. Morten, A. Masoero, M. Prudenziati +1
Статья1994Цитирований: 3ABIConduction in RuO<sub>2</sub>-based thick films†
Krzysztof Bobran, Andrzej Kusy, A. W. Stadler +1
Статья1995Цитирований: 2ABITunneling-percolation origin of nonuniversality: Theory and experiments
Sonia Vionnet-Menot, Claudio Grimaldi, Thomas Maeder +2
Статья2005Цитирований: 2ABI