Работы, цитирующие эту работу

Работ: 3

Работа: Molecular secondary ion formation under cluster bombardment: A fundamental review

1. Sputtering of GaAs target under Bi+ cluster ions bombardment

   Sh.Dj. Akhunov, G.P. Kakhramonova, Sh.M. Axmedov +2

   СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2022Цитирований: 1

   ABIABI:AkademIndex/openalex/2022.article.000824

2. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

   Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

   СтатьяIon-surface interactions and analysisSurface and Interface Analysis2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.article.008231

3. Emission of Negative Copper Cluster Ions as a Function of Temperature and Bombarding Ion Energy

   R. Djabbarganov, B. G. Atabaev, A. S. Khalmatov

   СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.019144