Работы, цитирующие эту работу

Работ: 2

Работа: Revealing inconsistencies in X-ray width methods for nanomaterials

1. Correlation between thickness-dependent morphology, phase structure, and vibrational properties of TiO2 thin films deposited via DC magnetron sputtering: A multi-technique characterization approach

   Б.Д. Игамов, I. R. Bekpulatov, A.M. Normamatov +2

   СтатьяZnO doping and propertiesNext Materials2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.001679

2. Comprehensive analysis of thickness-dependent structural, morphological, and optical properties of TiO2 based thin films

   B.D. Igamov, I.R. Bekpulatov, A.M. Normamatov +3

   СтатьяTiO2 Photocatalysis and Solar CellsResults in Optics2026Цитирований: 0

   ABIABI:AkademIndex/openalex/2026.article.000275