Работы, цитирующие эту работу

Работ: 2

Работа: Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices

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   СтатьяChalcogenide Semiconductor Thin FilmsThin Solid Films2018Цитирований: 4

   ABIABI:AkademIndex/openalex/2018.article.000311

2. Investigation of the surface recombination rate in polycrystalline films from the A⁶B⁶ compound by the MW-PC method

   Nodir Alimov, J. Vaitkus, Sardorbek Otajonov +1

   СтатьяAdvanced Semiconductor Detectors and MaterialsJournal of Physics Conference Series2022Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.551349