Работы, цитирующие эту работу

Работ: 1

1. Surface Morphology of NiSi2/Si Films Obtained by the Method of Solid-Phase Deposition

   A. K. Tashatov, N. M. Mustafoyeva

   СтатьяSemiconductor materials and interfacesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2020Цитирований: 3

   ABIABI:AkademIndex/openalex/2020.article.000913