Работы, цитирующие эту работу

Работ: 2

Работа: Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

1. Temperature Dependences of the Sputtering of Negative Silicon Cluster Ions

   Б.Г. Атабаев, R. Dzabbarganov, F. R. Yuzikaeva +3

   СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2023Цитирований: 0

   ABIABI:AkademIndex/openalex/2023.article.004220

2. Emission of Negative Copper Cluster Ions as a Function of Temperature and Bombarding Ion Energy

   R. Djabbarganov, B. G. Atabaev, A. S. Khalmatov

   СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.019144