Работы, цитирующие эту работу

Работ: 1

1. Study of the Composition of Uncontrolled Impurities and the Profiles of Their Distribution at the Ni–CdS Interface

   A. A. Abduvayitov, Kh. Kh. Boltaev, G. A. Rozikov

   СтатьяChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2022Цитирований: 0

   ABIABI:AkademIndex/openalex/2022.article.008003