E. Maydell-Ondrusz

1 та иш

Institute of Nuclear Physics, Kraków

1. Backscattering measurements of postimplantation damage profiles in silicon single crystals

   S. Kopta, E. Maydell-Ondrusz, Β. Rajchel

   МақолаCrystallography and Radiation Phenomenaphysica status solidi (a)19780 иқтибос

   ABIABI:AkademIndex/openalex/1978.article.000065