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Yu. A. Nikolaev

4 та иш

RAS - Ioffe Physico Technical Institute

  1. Influence of Fabrication Conditions on Properties of Si:Er Light-Emitting Structures

    Н. А. Соболев, A. M. Emel’yanov, Yu. A. Nikolaev +6

    МақолаSilicon Nanostructures and PhotoluminescenceMaterials science forum19970 иқтибос
    ABI

  2. Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er

    Н. А. Соболев, A. M. Emel’yanov, Yu. A. Kudryavtsev +8

    МақолаSilicon and Solar Cell TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19970 иқтибос
    ABI

  3. Defect Engineering in Si: Ho Light-Emitting Structure Technology

    Н. А. Соболев, A. M. Emel’yanov, R. N. Kyutt +1

    МақолаSilicon and Solar Cell TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19990 иқтибос
    ABI

  4. Temperature Dependence of Resistivity and Current-Voltage Characteristics of the Films of Composites Based on Modified Carbon Multiwalled Nanotubes and Graphite

    A. A. Babaev, P. P. Khokhlachev, Yu. A. Nikolaev +5

    МақолаCarbon Nanotubes in CompositesElectronic Sumy State University Institutional Repository (Sumy State University)20130 иқтибос
    ABI