В. И. Сахаров

5 та иш

RAS - Ioffe Physico Technical Institute

1. Influence of Fabrication Conditions on Properties of Si:Er Light-Emitting Structures

   Н. А. Соболев, A. M. Emel’yanov, Yu. A. Nikolaev +6

   МақолаSilicon Nanostructures and PhotoluminescenceMaterials science forum19970 иқтибос

   ABIABI:AkademIndex/openalex/1997.article.000189

2. Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er

   Н. А. Соболев, A. M. Emel’yanov, Yu. A. Kudryavtsev +8

   МақолаSilicon and Solar Cell TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19970 иқтибос

   ABIABI:AkademIndex/openalex/1997.article.000191

3. Study of the growth of YBa2Cu3O7−x films on a Al2O3 single crystal with a CeO2 buffer sublayer

   V. V. Afrosimov, E. K. Gol’man, R. N. Il’in +6

   МақолаPhysics of Superconductivity and MagnetismTechnical Physics Letters19980 иқтибос

   ABIABI:AkademIndex/openalex/1998.article.000176

4. Component composition and strain of barium-strontium titanate ferroelectric films

   S. F. Karmanenko, А. И. Дедык, N. N. Isakov +4

   МақолаFerroelectric and Piezoelectric MaterialsTechnical Physics Letters19990 иқтибос

   ABIABI:AkademIndex/openalex/1999.article.000083

5. Dependence of the microwave surface resistance on the structure and thickness of superconducting cuprate films

   S. F. Karmanenko, A. A. Svishchev, А. А. Семенов +3

   МақолаPhysics of Superconductivity and MagnetismTechnical Physics Letters19990 иқтибос

   ABIABI:AkademIndex/openalex/1999.article.000165