Kh.Sh. Daliev

1 та иш

1. Capacitance transient spectroscopy of radiation defects on Si-SiO 2 interface of silicon mis-structures

   Kh.Sh. Daliev, Sharifa B. Utamuradova, A.J. Akbarov

   МақолаSilicon and Solar Cell Technologies19990 иқтибос

   ABIABI:AkademIndex/openalex/1999.article.000271