Ушбу иш иқтибос қилган ишлар

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Иш: New potential applications of scanning electron microscopy to studying InAsSb/InAsSbP lasers

1. 2.7–3.9 μm InAsSb(P)/InAsSbP low threshold diode lasers

   А. Н. Баранов, A. N. Imenkov, V. V. Sherstnev +1

   Мақола19944 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.609556

2. Scanning Electron Microscopy and X-Ray Microanalysis

   Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael +3

   Китоб20173 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.219508

3. Scanning Electron Microscopy and X-Ray Microanalysis

   Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin +3

   Китоб19812 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.433883

4. Continuous wave operation of InAs/InAs<i>x</i>Sb1−<i>x</i> midinfrared lasers

   Yong‐Hang Zhang

   Мақола19952 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.526755

5. Midwave (4 μm) infrared lasers and light-emitting diodes with biaxially compressed InAsSb active regions

   S. R. Kurtz, R. M. Biefeld, L. R. Dawson +2

   Мақола19942 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.623528

6. Modern trends in diode laser spectroscopy

   Alexander I. Nadezhdinskii, A. M. Prokhorov

   Мақола19922 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.623529

7. Single-frequency InAsSb lasers emitting at 3.4 μm

   А. А. Попов, V. V. Sherstnev, Yury P. Yakovlev +2

   Мақола19962 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.666736