Ушбу ишга иқтибос қилган ишлар

3 та иш

Иш: Composition of uncontrolled impurities and their chemical states and depth profiles at the Al-Si interface

1. Study of the Composition of Uncontrolled Impurities and the Profiles of Their Distribution at the Ni–CdS Interface

   A. A. Abduvayitov, Kh. Kh. Boltaev, G. A. Rozikov

   МақолаChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.article.008003

2. The influence of implantation of Mg+ ions and subsequent annealing on the composition, electronic structures, emission and optical properties of CdF2

   A. A. Abduvayitov, Gunel Imanova, Д. А. Ташмухамедова +2

   МақолаElectron and X-Ray Spectroscopy TechniquesScientific Herald of Uzhhorod University Series Physics20230 иқтибос

   ABIABI:AkademIndex/openalex/2023.article.012489

3. Study of regularities of formation of thin three-component CdMgTe films on CdTe(111) surface upon implantation of Mg ions and subsequent annealing

   Д. А. Ташмухамедова, A. A. Abduvayitov, X. X. Boltaev +2

   МақолаAdvanced Semiconductor Detectors and MaterialsAIP conference proceedings20250 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.007142