Ушбу иш иқтибос қилган ишлар

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Иш: EFFECT OF TEMPERATURE TREATMENT ON THE ENERGY SPECTRUM OF DEFECTS IN SILICON DOPED WITH MOLYBDENUM

1. Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

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2. Transition metals in silicon

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3. Capacitance Transient Spectroscopy

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4. Electrical observation of the Au-Fe complex in silicon

   S. D. Brotherton, Peter D. Bradley, A. Gill +1

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   ABIABI:AkademIndex/openalex/2026.other.682680

5. Deep Level Transient Spectroscopy of Silicon, Doped by Zirconium

   Shakhrukh Kh. Daliev

   МақолаIon-surface interactions and analysisInternational Journal for Research in Applied Science and Engineering Technology20181 иқтибос

   ABIABI:AkademIndex/openalex/2018.article.000622

6. Energy Spectrum of Defective Centers in Silicon Doped with Molybdenum

   Shakhrukh Kh. Daliev, Shoira Usmanova, Anifa Paluanova +21

   МақолаSemiconductor materials and interfacesInternational Journal of Emerging Trends in Engineering Research20201 иқтибос

   ABIABI:AkademIndex/openalex/2020.article.002161

7. Сарлавҳасиз

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