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Study of the Mobility and Electrical Conductivity of Chromium Silicide

M. Sh. IsaevNational University of Uzbekistan, Tashkent, UzbekistanTokhirjon U. AtamirzaevNamangan Engineering Construction Institute, Namangan, UzbekistanMukhammadsodik N. MamatkulovTashkent Institute of Chemical Technology, Tashkent, UzbekistanU. T. AsatovTashkent Institute of Chemical Technology, Tashkent, UzbekistanMakhmudjon A. TulametovTashkent Institute of Chemical Technology, Tashkent, Uzbekistan
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The temperature dependence of the mobility in chromium silicides in the temperature range of 80 ÷ 780 K was studied. The mobility gradually increases to a temperature of 350 K, then it saturates in the temperature range of 350 ÷ 450K, then gradually decreases. It is shown that the mobility depends on the scatter of charge of carriers on a crystal lattice, impurity ions, dislocations, and silicide inclusions. The frequency of collisions is proportional to T3/2, and the mobility varies with temperature as T-3/2. At high temperatures, phonons may be considered as “frozen” defects and collision frequency with its will proportional to T. The temperature dependences of the electrical conductivity in this temperature range were also studied. Areas with negative and positive temperature coefficients are revealed.

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