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Иш: Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy
Kinetics of aggregations of F 2, F 3, X, and colloid centers in LiF/Si(111) films upon low-temperature annealing
Utkirjon Sharopov, Б.Г. Атабаев, R. Djabberganov +1
МақолаElectron and X-Ray Spectroscopy TechniquesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques201311 иқтибосABIComputer Simulation of Scattering Xe<sup>+</sup> Ions from InP(001)❬110❭ Surface at Grazing Incidence
Karimov Mukhtorjon Karimberganovich, Matchоnov Khusniddin Jamoladdinovich, Otaboeva Kamola Uchkun qizi +1
МақолаIon-surface interactions and analysise-Journal of Surface Science and Nanotechnology201911 иқтибосABIGraphene and two-dimensional materials for silicon technology
Deji Akinwande, Cedric Huyghebaert, Ching-Hua Wang +5
Шарҳ мақола20193 иқтибосABIQuantum-dimensional structures produced by ion implantation
Н. Н. Герасименко, Yu. N. Parhomenko, V.Yu. Troitskiy +4
Мақола20033 иқтибосABINanopurification of silicon from 84% to 99.999% purity with a simple and scalable process
Linqi Zong, Bin Zhu, Zhenda Lu +7
Мақола20152 иқтибосABI