М. К. Рузибаева
13 та иш
Arifov Institute of Electronics, Academy of Sciences of the Republic of Uzbekistan, ul. Khodzhaeva 33, Akademgorodok, Tashkent, 100125, Uzbekistan
Investigation of change of the composition and structure of the CaF2/Si films surface at the low-energy bombardment
Б. Е. Умирзаков, Д. А. Ташмухамедова, М. К. Рузибаева +2
МақолаSilicon Nanostructures and PhotoluminescenceNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms201413 иқтибосABIA study of the influence of surface layers’ disordering on the spectrum of energy losses of electrons passed through copper thin single crystal films
З. А. Исаханов, М. К. Рузибаева, Б. Е. Умирзаков +1
МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20112 иқтибосABIA study of the orientation dependence of the electron energy loss spectra for single crystal films of copper and silver
А. А. Алиев, З. А. Исаханов, М. К. Рузибаева
МақолаElectron and X-Ray Spectroscopy TechniquesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20121 иқтибосABI