М. К. Рузибаева
Работ: 13
Arifov Institute of Electronics, Academy of Sciences of the Republic of Uzbekistan, ul. Khodzhaeva 33, Akademgorodok, Tashkent, 100125, Uzbekistan
Investigation of change of the composition and structure of the CaF2/Si films surface at the low-energy bombardment
Б. Е. Умирзаков, Д. А. Ташмухамедова, М. К. Рузибаева +2
СтатьяSilicon Nanostructures and PhotoluminescenceNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2014Цитирований: 13ABIA study of the influence of surface layers’ disordering on the spectrum of energy losses of electrons passed through copper thin single crystal films
З. А. Исаханов, М. К. Рузибаева, Б. Е. Умирзаков +1
СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2011Цитирований: 2ABIA study of the orientation dependence of the electron energy loss spectra for single crystal films of copper and silver
А. А. Алиев, З. А. Исаханов, М. К. Рузибаева
СтатьяElectron and X-Ray Spectroscopy TechniquesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2012Цитирований: 1ABI