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Иш: Research of the Impact of Silicon Doping with Holmium on its Structure and Properties Using Raman Scattering Spectroscopy Methods
Raman spectroscopic study of microcrystalline silica
Kathleen J. Kingma, Russell J. Hemley
Мақола19946 иқтибосABIElectrophysical properties of silicon doped with lutetium
Sh.Kh. Daliev, Sharifa B. Utamuradova
Мақола20244 иқтибосABIRaman Spectra of Amorphous Si and Related Tetrahedrally Bonded Semiconductors
J.E. Smith, M. H. Brodsky, B. L. Crowder +2
Мақола19713 иқтибосABI