Ушбу ишга иқтибос қилган ишлар

3 та иш

Иш: On the Properties of the Si-SiO2 Transition Layer in Multilayer Silicon Structures

1. STUDYING THE INFLUENCE OF PROTON IRRADIATION ON THE DISTRIBUTION PROFILE OF Pt AND Cr IN SURFACE LAYERS n-Si˂Pt˃, n-Si˂Сr˃ USING ELLIPSOMETRIC SPECTROSCOPY

   Sharifa B. Utamuradova

   МақолаAdvanced Materials Characterization TechniquesAdvanced Physical Research20241 иқтибос

   ABIABI:AkademIndex/openalex/2024.article.001560

2. Properties of Single Crystal Silicon Doped with Vanadium

   Kh.S. Daliev, Zafarjon M. Khusanov

   МақолаChalcogenide Semiconductor Thin FilmsEast European Journal of Physics20241 иқтибос

   ABIABI:AkademIndex/openalex/2024.article.002064

3. Influence of Doping Conditions on the Properties of Nickel Atom Clusters

   Kanatbay A. Ismailov, Zlikha M. Saparniyazova, Gulchekhra T. Kudeshova +2

   МақолаMaterial Properties and ApplicationsEast European Journal of Physics20241 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.589127