Ушбу ишга иқтибос қилган ишлар

5 та иш

Иш: Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

   Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.493020

2. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.413689

3. Indium sputtering upon bombardment with cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20122 иқтибос

   ABIABI:AkademIndex/openalex/2012.article.000247

4. Cluster projectile ions used for the SIMS analysis of silicon

   Sh.Dj. Akhunov, С. Н. Морозов

   МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 иқтибос

   ABIABI:AkademIndex/openalex/2013.article.000207

5. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisTechnical Physics20130 иқтибос

   ABIABI:AkademIndex/openalex/2013.article.000300