Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Crystallite size determination in μc-Ge films by x-ray diffraction and Raman line profile analysis

1. Defective Structure of Silicon Doped with Dysprosium

   Khodjakbar S. Daliev, Sharifa B. Utamuradova, Alisher Khaitbaev +3

   МақолаSilicon Nanostructures and PhotoluminescenceEast European Journal of Physics20243 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.412289

2. Changes in the Structure and Properties of Silicon During Ytterbium Doping: The Results of o Comprehensive Analysis

   Kh.S. Daliev, Sharifa B. Utamuradova, Jonibek J. Khamdamov +3

   МақолаSilicon Nanostructures and PhotoluminescenceEast European Journal of Physics20242 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.432368