Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: A propagation concept of negative bias temperature instability along the channel length in p-type metal oxide field effect transistor

1. Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection

   A. É. Atamuratov, Ahmed Yusupov, Zamira Atamuratova +2

   МақолаSemiconductor materials and devicesApplied Sciences20203 иқтибос

   ABIABI:AkademIndex/openalex/2020.article.000900

2. Capacitance Method for Identifying Degradation due to Electrical Stress in MOSFETs

   Zamira Atamuratova, Ahmed Yusupov, Jean Chamberlain Chedjou +1

   МақолаSemiconductor materials and devicese-Journal of Surface Science and Nanotechnology20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.article.006400