Ушбу ишга иқтибос қилган ишлар

5 та иш

Иш: Simulated annealing analysis of Rutherford backscattering data

1. Fabrication of Metal's Nanoparticles in Silicon and Sapphire by Low Energy Ion Implantation

   D. Kh. Mirkarimov, T.D. Radjabov, A.I. Kamardin +1

   МақолаNonlinear Optical Materials Studies20071 иқтибос

   ABIABI:AkademIndex/openalex/2007.article.000251

2. Ion-beam irradiation effects on reactively sputtered CrN layers

   M. Novaković, M. Popović, N. Bibić

   МақолаMetal and Thin Film MechanicsProcessing and Application of Ceramics20110 иқтибос

   ABIABI:AkademIndex/openalex/2011.article.000248

3. Structural changes induced by argon ion irradiation in TiN thin films

   M. Popović, M. Novaković, Zlatko Rakočević +1

   МақолаMetal and Thin Film MechanicsProcessing and Application of Ceramics20110 иқтибос

   ABIABI:AkademIndex/openalex/2011.article.000256

4. Study of doping uniformity of a 200 kV ion implanter by RBS and sheet resistance measurements

   Hui Li, Ze-Song Wang, Shengjun Zhang +5

   МақолаIon-surface interactions and analysisNuclear Science and Techniques20160 иқтибос

   ABIABI:AkademIndex/openalex/2016.article.000334

5. Hierarchical film formation and structural characterization using MeV-ion beams

   Hui Li, Zesong Wang, Shi Ting +7

   МақолаZnO doping and propertiesSurface and Coatings Technology20160 иқтибос

   ABIABI:AkademIndex/openalex/2016.article.000418