Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

1. Temperature Dependences of the Sputtering of Negative Silicon Cluster Ions

   Б.Г. Атабаев, R. Dzabbarganov, F. R. Yuzikaeva +3

   МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20230 иқтибос

   ABIABI:AkademIndex/openalex/2023.article.004220

2. Emission of Negative Copper Cluster Ions as a Function of Temperature and Bombarding Ion Energy

   R. Djabbarganov, B. G. Atabaev, A. S. Khalmatov

   МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20250 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.019144