Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Regular Dislocation Networks in Silicon as a Tool for Nanostructure Devices used in Optics, Biology, and Electronics

1. Sensitivity of dislocation engineered Si p-n junctions to influence of illumination and ultrasound

   A.Sh. Davletova, Smagul Karazhanov

   МақолаSemiconductor materials and interfacesInorganic Materials20090 иқтибос

   ABIABI:AkademIndex/openalex/2009.article.000359

2. Сарлавҳасиз

   M. Sh. Abdullayev, Mirabbos Yo, Zilola Madaminova +56

   БошқаUniversum Technical sciences20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.other.001134