M.R. Bendilov

1 ta ish

1. Investigation of the transparent dielectric defect structure using the emission of multiply charged ions

   R. Abdupataev, M.R. Bendilov, Kh.B. Bejsembaeva +1

   MaqolaIntegrated Circuits and Semiconductor Failure Analysis19861 iqtibos

   ABIABI:AkademIndex/2026.other.285814