L. C. Feldman

3 ta ish

AT&T (United States)

1. Structure determination of the Si(111):B(√3×√3)<i>R</i>30° surface: Subsurface substitutional doping

   Randall L. Headrick, Ian Robinson, Elias Vlieg +1

   Maqola19892 iqtibos

   ABIABI:AkademIndex/2026.other.362841

2. Fundamentals of surface and thin film analysis

   L. C. Feldman, James W. Mayer, M. Grasserbauer

   Maqola19872 iqtibos

   ABIABI:AkademIndex/2026.other.382140

3. Fundamentals of surface and thin film analysis

   L. C. Feldman, James W. Mayer, F. Adams

   Maqola19892 iqtibos

   ABIABI:AkademIndex/2026.other.609020