J. R. Leite
1 ta ish
University of São Paulo
Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
M. Martinelli, S. Bian, J. R. Leite +1
Maqola19985 iqtibosABI
Kashfiyot
Xizmatlar
Ishlab chiquvchilar uchun
1 ta ish
University of São Paulo
M. Martinelli, S. Bian, J. R. Leite +1