M. Martinelli
4 ta ish
National Institute for Nuclear Physics, Rome I Division
Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
M. Martinelli, S. Bian, J. R. Leite +1
Maqola19985 iqtibosABIEuclid Quick Data Release (Q1)
N. E. P. Lines, T. E. Collett, P. Holloway +97
MaqolaOchiq kirish20260 iqtibosABI