H. Hieslmair

2 ta ish

Lawrence Berkeley National Laboratory

1. Iron contamination in silicon technology

   A. A. Istratov, H. Hieslmair, E. R. Weber

   Maqola20006 iqtibos

   ABIABI:AkademIndex/2026.other.712514

2. X-ray beam induced current—a synchrotron radiation based technique for the <i>in situ</i> analysis of recombination properties and chemical nature of metal clusters in silicon

   О. Ф. Вывенко, Tonio Buonassisi, A. A. Istratov +4

   Maqola20024 iqtibos

   ABIABI:AkademIndex/2026.other.500796