Sh.S. Daliev

2 ta ish

Oʻzbekiston Milliy Universiteti

1. Influence of thermal treatment on characteristics of silicon doped by lanthanium

   Sharifa B. Utamuradova, Shakhrukh Kh. Daliev, E. K. Kalandarov +1

   MaqolaSemiconductor materials and interfacesUzbekiston Fizika Zhurnali20060 iqtibos

   ABIABI:AkademIndex/2006.article.000426

2. Studying influence of titanium and hafnium atoms on characteristics of volume and Si-SiO 2 interface of multilayer structures

   С. И. Власов, Sh.S. Daliev

   MaqolaAdvanced Materials Characterization TechniquesUzbekiston Fizika Zhurnali20110 iqtibos

   ABIABI:AkademIndex/2011.article.000538