А. И. Ковалев
2 ta ish
Central Research Institute of Ferrous Metallurgy I P Bardina
High-resolution X-ray photoelectron spectroscopy and characteristic electron-energy loss spectroscopy of the electronic structure of phosphorus-implanted silicon and quantum dots of silicon dioxide with silicon impurities
O. K. Kuvandikov, Э. У. Арзикулов, А. И. Ковалев +1
MaqolaSilicon Nanostructures and PhotoluminescenceJournal of Communications Technology and Electronics20070 iqtibosABI