Э. У. Арзикулов
27 ta ish
Sharof Rashidov nomidagi Samarqand davlat universiteti
High-resolution X-ray photoelectron spectroscopy and characteristic electron-energy loss spectroscopy of the electronic structure of phosphorus-implanted silicon and quantum dots of silicon dioxide with silicon impurities
O. K. Kuvandikov, Э. У. Арзикулов, А. И. Ковалев +1
MaqolaSilicon Nanostructures and PhotoluminescenceJournal of Communications Technology and Electronics20070 iqtibosABIКОМБИНАЦИОННОЕ РАССЕЯНИЕ СВЕТА В ПОЛУПРОВОДНИКОВЫХ ПРОВОЛОКАХ
Б. Эшпулатов, Э. У. Арзикулов, D. Sh. Khuzhanova
MaqolaOchiq kirish20100 iqtibosABIInvestigations of the formation of nanosized objects in manganese implanted silicon single crystals by the methods of Raman scattering of light and atomic force microscopy
Э. У. Арзикулов, F. Salakhitdinov, F Kholmurodov +1
MaqolaOchiq kirishIon-surface interactions and analysisJournal of Physics Conference Series20230 iqtibosABINumerical prediction of the tensile strength of composite T-joints considering multiple failure criteria and damage degradation models
Xiaoqiang Wang, Rui Zhang, Chengkun Ma +7
MaqolaStructural Analysis and OptimizationInternational Journal of Computational Materials Science and Engineering20250 iqtibosABI