Hyung-wook Kim

1 ta ish

Samsung (South Korea)

1. Impact of Off-State Stress and Negative Bias Temperature Instability on Degradation of Nanoscale pMOSFET

   Nam-Hyun Lee, Hyung-wook Kim, Bongkoo Kang

   Maqola20114 iqtibos

   ABIABI:AkademIndex/2026.other.536305