Bongkoo Kang

4 ta ish

Pohang University of Science and Technology

1. Impact of Off-State Stress and Negative Bias Temperature Instability on Degradation of Nanoscale pMOSFET

   Nam-Hyun Lee, Hyung-wook Kim, Bongkoo Kang

   Maqola20114 iqtibos

   ABIABI:AkademIndex/2026.other.536305

2. Method to predict length dependency of negative bias temperature instability degradation in p-MOSFETs

   Jihoon Seo, Gang-Jun Kim, Donghee Son +3

   Maqola20163 iqtibos

   ABIABI:AkademIndex/2026.other.536313

3. Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET

   Yeohyeok Yun, Jihoon Seo, Young-Kyu Kwon +1

   Maqola20193 iqtibos

   ABIABI:AkademIndex/2026.other.536320

4. Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress

   Yeohyeok Yun, Jihoon Seo, Donghee Son +1

   Maqola20182 iqtibos

   ABIABI:AkademIndex/2026.other.536318