Yeohyeok Yun

1 ta ish

Pohang University of Science and Technology

1. Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress

   Yeohyeok Yun, Jihoon Seo, Donghee Son +1

   Maqola20182 iqtibos

   ABIABI:AkademIndex/2026.other.536318