Yeohyeok Yun

1 ta ish

Pohang University of Science and Technology

1. Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET

   Yeohyeok Yun, Jihoon Seo, Young-Kyu Kwon +1

   Maqola20193 iqtibos

   ABIABI:AkademIndex/2026.other.536320