Mahkam Halillaev

1 ta ish

Urganch davlat universiteti

1. Simulation of Random Telegraph Noise in Nanometer nMOSFET Induced by Interface and Oxide Trapped Charge

   A. É. Atamuratov, R. Granzner, M. Kittler +3

   BobSemiconductor materials and devicesNATO science for peace and security series. B, Physics and biophysics20130 iqtibos

   ABIABI:AkademIndex/2013.chapter.000013