Chi‐Hsin Huang

1 ta ish

National Hsinchu University of Education

1. Tunable defect engineering in TiON thin films by multi-step sputtering processes: from a Schottky diode to resistive switching memory

   Teng‐Yu Su, Chi‐Hsin Huang, Yu‐Chuan Shih +5

   MaqolaAdvanced Memory and Neural ComputingJournal of Materials Chemistry C20170 iqtibos

   ABIABI:AkademIndex/2017.article.000071