Michael Niehle

1 ta ish

Paul Drude Institute for Solid State Electronics

1. On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study

   Michael Niehle, Jean‐Baptiste Rodriguez, L. Cerutti +2

   Maqola20172 iqtibos

   ABIABI:AkademIndex/2026.other.381580