Jean‐Baptiste Rodriguez

2 ta ish

French National Centre for Scientific Research

1. On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study

   Michael Niehle, Jean‐Baptiste Rodriguez, L. Cerutti +2

   Maqola20172 iqtibos

   ABIABI:AkademIndex/2026.other.381580

2. X-ray diffraction study of GaSb grown by molecular beam epitaxy on silicon substrates

   Jean‐Baptiste Rodriguez, K. Madiomanana, L. Cerutti +2

   Maqola20162 iqtibos

   ABIABI:AkademIndex/2026.other.385138