Maksim Vinnichenko

5 ta ish

Peter the Great St. Petersburg Polytechnic University

1. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device

   K.T. Dovranov, Maksim Vinnichenko, V.V. Korablev +3

   MaqolaChalcogenide Semiconductor Thin Films20242 iqtibos

   ABIABI:AkademIndex/2024.article.003101

2. Obtaining Thin Films from Semiconductor Compounds and Their X-Ray Analysis

   K.T. Dovranov, Maksim Vinnichenko, Asilbek Kodirov +6

   MaqolaSurface and Thin Film Phenomena20242 iqtibos

   ABIABI:AkademIndex/2024.article.003102

3. Photoinduced Absorption Spectrum of GeSi/Si Quantum Dots in the Mid-IR and Terahertz Ranges under Resonant and Non-resonant Optical Pumping

   Danila Kararulov, Ratmir V. Ustimenko, G A Melentev +6

   MaqolaPhotonic and Optical Devices20240 iqtibos

   ABIABI:AkademIndex/2024.article.009016

4. Electrophysical Properties and Surface Characteristics of BaTiO ₃ Thin Films Produced by Ion-Plasma Method

   K.T. Dovranov, Muradulla Normuradov, I. R. Bekpulatov +6

   MaqolaFerroelectric and Piezoelectric Materials20250 iqtibos

   ABIABI:AkademIndex/2025.article.010647

5. Surface Morphology of Ni/GaAs Thin Films Produced by Ion-Plasma Method

   K.T. Dovranov, Shakhnoza Jurayeva, Muradulla Normuradov +6

   MaqolaSurface Roughness and Optical Measurements20250 iqtibos

   ABIABI:AkademIndex/2025.article.010648