Eun Dong Kim
1 ta ish
Korea Electrotechnology Research Institute (KERI)
Structural and Electrical Quality of Silicon Bicrystals Fabricated by a Modified Direct Bonding Technique
T. S. Argunova, M. Yu. Gutkin, L. S. Kostina +3
MaqolaThin-Film Transistor TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19990 iqtibosABI