R. Casiraghi

3 ta ish

Dept. of Electronics Engin. and Information Science, Politecnico of Milano (Italy)

1. SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range

   G. Bertuccio, R. Casiraghi, E. Gatti +5

   MaqolaParticle Detector Development and PerformanceMaterials science forum20030 iqtibos

   ABIABI:AkademIndex/openalex/2003.article.000102

2. Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors

   G. Bertuccio, S. Binetti, S. Caccia +9

   MaqolaSilicon Carbide Semiconductor TechnologiesMaterials science forum20050 iqtibos

   ABIABI:AkademIndex/openalex/2005.article.000153

3. Study of Ion Induced Damage in 4H-SiC

   Alessandro Lo Giudice, P. Oliveira, F. Fizzotti +6

   MaqolaIntegrated Circuits and Semiconductor Failure AnalysisMaterials science forum20050 iqtibos

   ABIABI:AkademIndex/openalex/2005.article.000188