Jung Ho Je

2 ta ish

Pohang University of Science and Technology

1. X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

   T. S. Argunova, M. Yu. Gutkin, Jung Ho Je +5

   MaqolaSilicon Carbide Semiconductor TechnologiesMaterials science forum20040 iqtibos

   ABIABI:AkademIndex/openalex/2004.article.000164

2. Structural Transformation of Dislocated Micropipes in Silicon Carbide

   M. Yu. Gutkin, A. G. Sheĭnerman, T. S. Argunova +4

   MaqolaAdvanced Surface Polishing TechniquesMaterials science forum20040 iqtibos

   ABIABI:AkademIndex/openalex/2004.article.000208