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E. V. Rakova

1 ta ish

Shubnikov Institute of Crystallography of Federal Scientific Research Centre “Crystallography and Photonics,”, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, Russia

  1. Electron microscopy characterization of higher manganese silicide film structure on silicon

    Andrey Orekhov, T. S. Kamilov, Anton S. Orekhov +3

    MaqolaSemiconductor materials and interfacesNanotechnologies in Russia20167 iqtibos
    ABI