Elmira M. Naurzalieva

3 ta ish

Institute of Semiconductor Physics and Microelectronics of National University of Uzbekistan, Tashkent, Uzbekistan

1. Investigation of Defect Formation in Silicon Doped with Silver and Gadolinium Impurities by Raman Scattering Spectroscopy

   Sharifa B. Utamuradova, Shakhrukh Kh. Daliev, Elmira M. Naurzalieva +1

   MaqolaSilicon Nanostructures and PhotoluminescenceEast European Journal of Physics20238 iqtibos

   ABIABI:AkademIndex/openalex/2023.article.000820

2. Enhancing the Perfection of a Silicon Crystal Doped with Nickel and Zinc Impurities

   Daryabay Muratbaevich Esbergenov, Elmira M. Naurzalieva, Sabirbay A. Tursinbaev

   MaqolaSilicon and Solar Cell TechnologiesEast European Journal of Physics20232 iqtibos

   ABIABI:AkademIndex/openalex/2023.article.002749

3. NICKEL-RELATED COMPLEX DEFECTS IN SILICON

   Sayfillo Saidovich Nasriddinov, Daryabay Muratbaevich Esbergenov, Elmira M. Naurzalieva

   MaqolaSilicon Nanostructures and PhotoluminescenceEuropean Science Review20210 iqtibos

   ABIABI:AkademIndex/openalex/2021.article.009259