New Applications of Diffraction Analysis for Dislocation Structure in High Lattice-Mismatch MBE Grown Epitaxial Structures
R. N. KyuttJ. HeydenreichS. RuvimovR. ScholzT. S. ArgunovaIoffe Physicotechnical Institute RASSergei IvanovRussian Academy of SciencesP. S. Kop’evRussian Academy of SciencesL. M. SorokinRussian Academy of Sciences
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenabook series1993en
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