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35 ta ish

Ish: Sputtering of GaAs target under Bi+ cluster ions bombardment

  1. Surface ionization of organic compounds and its applications

    У. Х. Расулев, É. Ya. Zandberg

    Maqola198837 iqtibos
    ABI

  2. The fragmentation of sputtered cluster ions and their contribution to secondary ion mass-spectra

    Н. Х. Джемилев, У. Х. Расулев, С. В. Верхотуров

    Maqola198718 iqtibos
    ABI

  3. The formation of clusters during ion induced sputtering of metals

    A. Wucher, Michael Wahl

    Maqola199613 iqtibos
    ABI

  4. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisTechnical Physics Letters200312 iqtibos
    ABI

  5. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 iqtibos
    ABI

  6. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisApplied Surface Science200411 iqtibos
    ABI

  7. The emission of neutral clusters in sputtering

    Hubert Gnaser, Wolfgang Höfer

    Maqola19899 iqtibos
    ABI

  8. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

    MaqolaIon-surface interactions and analysisVacuum20009 iqtibos
    ABI

  9. Impact of slow gold clusters on various solids: nonlinear effects in secondary ion emission

    M. Benguerba, Alain Brunelle, S. Della‐Negra +7

    Maqola19916 iqtibos
    ABI

  10. Sputtering of indium using<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi mathvariant="normal">Au</mml:mi><mml:mi>m</mml:mi></mml:msub></mml:math>projectiles: Transition from linear cascade to spike regime

    A.V. Samartsev, A. Duvenbeck, A. Wucher

    Maqola20054 iqtibos
    ABI

  11. Nonadditive sputtering of silicon by keV energy molecular projectiles of heavy and light elements

    S.F. Belykh, A.P. Kovarsky, Vladimir Palitsin +2

    Maqola20013 iqtibos
    ABI

  12. Model for the emission of quasi-thermal atoms during sputtering of metals in the nonlinear collision cascade regime

    S.F. Belykh, А. Б. Толстогузов, A. A. Lozovan +2

    Maqola20143 iqtibos
    ABI

  13. Molecular secondary ion formation under cluster bombardment: A fundamental review

    A. Wucher

    Sharh maqola20063 iqtibos
    ABI

  14. Sputtering of silicon by atomic and cluster bismuth ions: An influence of projectile nuclearity and specific kinetic energy on the sputter yield

    A. Tolstogouzov, Paul Mazarov, A.E. Ieshkin +4

    Maqola20213 iqtibos
    ABI

  15. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions

    Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov

    MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20213 iqtibos
    ABI

  16. Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions

    Robyn E. Goacher, Hong Luo, Joseph A. Gardella

    Maqola20082 iqtibos
    ABI

  17. Sarlavhasiz

    Boshqa2 iqtibos
    ABI

  18. Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement

    Andreas Heile, D. Lipinsky, Nimer Wehbe +8

    Maqola20082 iqtibos
    ABI

  19. Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials

    M. P. Seah

    Maqola20072 iqtibos
    ABI

  20. Recent Progress in Cluster Beam Technique

    Jiro Matsuo, Makiko Fujii, Toshio Seki +1

    Maqola20162 iqtibos
    ABI

  21. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 iqtibos
    ABI

  22. Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization

    Hua Tian, A. Wucher, Nicholas Winograd

    Maqola20162 iqtibos
    ABI

  23. Nonlinear effects in low-energy ion sputtering of solids

    Yuriy Kudriavtsev, R. Asomoza, A. G. Hernández +3

    Maqola20202 iqtibos
    ABI

  24. Sarlavhasiz

    Boshqa1 iqtibos
    ABI

  25. Sarlavhasiz

    Boshqa1 iqtibos
    ABI